首页|An analysis of heuristic metrics for classifier ensemble pruning based on ordered aggregation

An analysis of heuristic metrics for classifier ensemble pruning based on ordered aggregation

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Classifier ensemble pruning is a strategy through which a subensemble can be identified via optimizing a predefined performance criterion. Choosing the optimum or suboptimum subensemble decreases the initial ensemble size and increases its predictive performance. In this article, a set of heuristic metrics will be analyzed to guide the pruning process. The analyzed metrics are based on modifying the order of the classifiers in the bagging algorithm, with selecting the first set in the queue. Some of these criteria include general accuracy, the complementarity of decisions, ensemble diversity, the margin of samples, minimum redundancy, discriminant classifiers, and margin hybrid diversity. The efficacy of those metrics is affected by the original ensemble size, the required subensemble size, the kind of individual classifiers, and the number of classes. While the efficiency is measured in terms of the computational cost and the memory space requirements. The performance of those metrics is assessed over fifteen binary and fifteen multiclass benchmark classification tasks, respectively. In addition, the behavior of those metrics against randomness is measured in terms of the distribution of their accuracy around the median. Results show that ordered aggregation is an efficient strategy to generate subensembles that improve both predictive performance as well as computational and memory complexities of the whole bagging ensemble. (c) 2021 The Authors. Published by Elsevier Ltd. This is an open access article under the CC BY-NC-ND license ( http://creativecommons.org/licenses/by-nc-nd/4.0/ )

Heuristic optimizationEnsemble selectionEnsemble pruningClassifier ensembleMachine learningDifficult samplesOrdering-based pruningClassifier complementarinessSTATISTICAL COMPARISONSSELECTIONMARGINALGORITHM

Mohammed, Amgad M.、Onieva, Enrique、Wozniak, Michal、Martinez-Munoz, Gonzalo

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Univ Deusto

Wroclaw Univ Sci & Technol

Univ Autonoma Madrid

2022

Pattern Recognition

Pattern Recognition

EISCI
ISSN:0031-3203
年,卷(期):2022.124
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