半导体技术2025,Vol.50Issue(1) :46-54.DOI:10.13290/j.cnki.bdtjs.2025.01.007

一种前后台结合的Pipelined ADC校准技术

A Calibration Technique Combining Foreground and Background for Pipelined ADCs

薛颜 徐文荣 于宗光 李琨 李加燊
半导体技术2025,Vol.50Issue(1) :46-54.DOI:10.13290/j.cnki.bdtjs.2025.01.007

一种前后台结合的Pipelined ADC校准技术

A Calibration Technique Combining Foreground and Background for Pipelined ADCs

薛颜 1徐文荣 1于宗光 1李琨 1李加燊2
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作者信息

  • 1. 中国电子科技集团公司第五十八研究所,江苏无锡 214000
  • 2. 合肥工业大学微电子学院,合肥 230009
  • 折叠

摘要

针对Pipelined模数转换器(ADC)中采样电容失配和运放增益误差带来的非线性问题,提出了一种前后台结合的Pipelined ADC校准技术.前台校准技术通过对ADC量化结果的余量分析,补偿相应流水级的量化结果,后台校准技术基于伪随机(PN)注入的方式,利用PN的统计特性校准增益误差.本校准技术在系统级建模和RTL级电路设计的基础上,实现了现场可编程门阵列(FPGA)验证并成功流片.测试结果显示,在1 GS/s采样速率下,校准精度为14 bit的Pipelined ADC的有效位数从9.30 bit提高到9.99 bit,信噪比提高约4 dB,无杂散动态范围提高9.5 dB,积分非线性(INL)降低约10 LSB.

Abstract

Aiming at the nonlinear problems caused by sampling capacitor mismatch and operational amplifier gain error in the Pipelined analog-to-digital converter(ADC),a calibration technique combi-ning foreground and background was proposed.The foreground calibration technique compensated the quantization results of the corresponding pipeline level by analyzing the residual of the ADC quantization results.The background calibration technique was based on pseudorandom(PN)injection and utilized the statistical characteristics of PN to calibrate gain errors.On the basis of system level modeling and RTL level circuit design,this calibration technique achieved field-programmable gate array(FPGA)verification and the chip was successful fabricated.The test results show that at a sampling rate of 1 GS/s,a Pipelined ADC with a calibration accuracy of 14 bit has an increase in effective number from 9.30 bit to 9.99 bit,about 4 dB increase in signal-to-noise ratio,9.5 dB increase in the range without dynamic spurious noise,and a decrease in integral nonlinearity(INL)of about 10 LSB.

关键词

Pipelined模数转换器(ADC)/电容失配/增益误差/前台校准/后台校准

Key words

Pipelined analog-to-digital converter(ADC)/capacitor mismatch/gain error/fore-ground calibration/background calibration

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出版年

2025
半导体技术
中国电子科技集团公司第十三研究所

半导体技术

北大核心
影响因子:0.232
ISSN:1003-353X
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