以太网物理层芯片光电特性测试研究
Test and Research of Ethernet Physical Layer Chip Photoelectric Characteristics
杨峰 1许少尉 1陈思宇1
作者信息
- 1. 航空工业西安航空计算技术研究所,陕西西安 710000
- 折叠
摘要
当前,以太网物理层芯片在诸多应用领域不可或缺,对以太网物理层芯片的功能性能要求也越来越高,因此,如何进行芯片功能性能方面的光电特性验证是亟待解决的问题.主要介绍了以太网物理层芯片验证的技术现状,提出符合以太网物理层芯片功能性能应用需求的光电特性测试方法,采用测试仪器(如示波器、逻辑分析仪、网络矢量分析仪等)和验证板卡对网络中物理接口的数据传输电特性和光特性进行测试,测试结果表明提出的测试方法达到了测试要求,满足了功能性能应用需求,进而提高了国产高可靠以太网物理层芯片验证的技术手段.
Abstract
At present,Ethernet physical layer chip is indispensable in the field of many applications,and the functional performance requirements of Ethernet physical layer chip is getting higher and higher.Therefore,how to verify the photoelectric characteristics of chip functional performance is an urgent problem to be solved.The technical status of verification of Ethernet physical layer chip is mainly introduced,and a photoelectric charac-teristic test method that meets the functional performance application requirements of Ethernet physical layer chip is put forward.Test instruments(such as oscilloscope,logic analyzer,network vector analyzer,etc.)and verification board are used to test the electrical and optical characteristics of data transmission of physical inter-faces in the network.The test results show that the proposed test method meets the test requirements,meets the application requirements of functional performance,and then improves the technical means of domestic high re-liability Ethernet physical layer chip verification.
关键词
芯片验证/物理层芯片/光电特性验证Key words
chip verification/physical layer chip/verification of photoelectric characteristics引用本文复制引用
基金项目
航空科学基金(6141B05060402)
出版年
2024
国家科技期刊平台
NSTL
万方数据