首页|Ge2Sb2Te5相变存储单元电热耦合模型的构建及功耗分析

Ge2Sb2Te5相变存储单元电热耦合模型的构建及功耗分析

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针对如何降低相变材料RESET操作功耗的问题,利用多物理场耦合分析手段构建了 T型结构相变存储单元的电热耦合模型;探讨了 Ge2Sb2Te5相变薄膜的厚度与电导率、加热电极的直径等参数对器件RESET过程峰值温度的影响,以及在加热电极中植入碳纳米缓冲层对改善器件RESET功耗的作用.研究结果表明:随着Ge2Sb2Te5薄膜厚度的增加、电导率的下降、加热电极直径的减小,器件RESET过程的电流呈下降趋势;T型结构单元中碳纳米缓冲层的植入,在激励电流强度不变的情形下,器件内部的峰值温度有了明显提高.
Construction and power consumption analysis of electrothermal coupling model of phase-change storage unit based on Ge2Sb2Te5
Aiming at the problem of how to reduce the power consumption of the RESET operation of PCM,the electrothermal coupling model of the T-structure PCM memory unit is constructed by means of multi-physics coupling analysis.The influence of Ge2Sb2Te5 phase change film thickness,conductivity and diameter of heating electrode on the RESET peak temperature of the device and the effect of implanting carbon nano buffer layer in the heating electrode on the RESET power consumption of the device are discussed.The research results indicate that the current during the device's RESET process shows a decreasing trend with the thickness of Ge2Sb2Te5 thin film increasing,the conductivity decreasing,and the diameter of the heating electrode reducing.The results show that with the increase of Ge2Sb2Te5 film thickness,the decrease of conductivity and the decrease of heating electrode diameter,the RESET current of the device decreases.When the carbon nano buffer layer is implanted in the T-structure unit,the peak temperature inside the device is obviously increased under the condition of constant excitation current intensity.

Ge2Sb2Te5phase change memoryRESET operationmulti-physics field coupling

吴卫华、马文静、徐胜卿、张勇、朱小芹

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江苏理工学院 数理学院,江苏常州 213001

Ge2Sb2Te5 相变存储器 RESET操作 多物理场耦合

2024

江苏理工学院学报
江苏技术师范学院

江苏理工学院学报

CHSSCD
影响因子:0.369
ISSN:2095-7394
年,卷(期):2024.30(6)