The core chips of state grid secondary electric equipment heavily rely on imports,posing a risk of power outage and threatening the power grid's security.At the same time,the number of autonomous chips deployed in existing secondary equipment is small,the degradation mechanism is complex,and the reliability is still being determined.How to evaluate its reliability needs to be studied.Because of this,this article proposes a failure rate prediction method suitable for secondary equipment chips and verifies its effectiveness through existing imported chips.Firstly,the failure rate prediction methods for newly developed products are analyzed and introduced.Secondly,according to the characteristics of the secondary equipment chip,a method of chip failure rate prediction combining accelerated life test and environmental factor correction is proposed.Thirdly,a failure rate estimation method based on equipment defect statistical data is proposed by combining the secondary equipment chip-module-system structure and equipment failure statistics data.The failure rate of imported chips is obtained using experimental methods and statistical data.Through analysis and comparison,the effectiveness of this method is verified in this article.Finally,based on the proposed method of accelerated life test and environmental factor correction,the failure rate of a certain autonomous chip is estimated and compared with imported chips.
关键词
芯片/二次设备/Arrhenius模型/加速寿命试验/环境因子/失效率
Key words
chip/secondary equipment/Arrhenius model/accelerated life test/environmental factor/failure rate
维普
万方数据