电子测量技术2024,Vol.47Issue(5) :16-21.DOI:10.19651/j.cnki.emt.2314966

基于FPGA的单光子时间数字转换器设计

Design of time-to-digital converter based on FPGA

何继爱 辛家乐 石麟泰
电子测量技术2024,Vol.47Issue(5) :16-21.DOI:10.19651/j.cnki.emt.2314966

基于FPGA的单光子时间数字转换器设计

Design of time-to-digital converter based on FPGA

何继爱 1辛家乐 1石麟泰1
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作者信息

  • 1. 兰州理工大学计算机与通信学院 兰州 730050
  • 折叠

摘要

针对单光子计数器对高速飞行光子时间测量的高分辨率要求,传统的TDC在时间测量上存在误差较大的不足.本文设计了一种利用FPGA内部逻辑延迟单元Carry4级联构建延迟链的TDC.该方法首先使用子链平均的方式进行数据采样,避免数据"气泡".其次,结合码密度测试和bin-by-bin校准将各级延迟单元宽度校准至接近均匀宽度,提高系统的测量精度.最后,通过Vivado软件仿真并烧录至ZYNQ7000进行板级测试,实验结果表明,该TDC能够在3ns的动态时间范围内实现时间分辨率10.91ps,差分非线性(DNL)范围为[-0.75,1.01]LSB,积分非线性(INL)范围为[-1.74,2.19]LSB.

Abstract

In view of the high-resolution requirements of single-photon counters for high-speed flight photon time measurement,the traditional time-to-digital converter TDC has the disadvantage of large errors in time measurement. This paper designs a TDC that uses the internal logic delay unit Carry4 of the FPGA to cascade to build a delay chain. The method firstly uses the method of sub chain average to sample the data and avoid the data "bubble". Secondly,the width of each delay cell is calibrated to nearly uniform width by combining the code density test and bin-by-bin calibration to improve the measurement accuracy of the system. Finally,Vivado software was simulated and burned to ZYNQ7000 for board-level testing. The experimental results show that the TDC can achieve time resolution 10.91 ps in the dynamic time range of 3 ns. DNL(DNL) range is[0.75,1.01]LSB,INL (INL) range for[1.74,2.19]LSB.

关键词

FPGA/时间数字转换/Carry4/码密度测试/差分非线性/积分非线性

Key words

FPGA/time digital conversion/Carry4/code density test/DNL/INL

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基金项目

国家自然科学基金(62361040)

出版年

2024
电子测量技术
北京无线电技术研究所

电子测量技术

CSTPCD北大核心
影响因子:1.166
ISSN:1002-7300
参考文献量5
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