首页|薄膜电容器加速寿命预测研究

薄膜电容器加速寿命预测研究

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为缩短高可靠性、长寿命薄膜电容器寿命评估周期,降低评估费用,针对薄膜电容器开展加速寿命预测方法研究.选择温度为加速应力,开展加速寿命试验,并根据电容器容量衰减特征,对测试结果进行线性拟合得到伪寿命数据.基于阿伦尼斯加速模型和威布尔分布模型,得到薄膜电容器常温条件下的寿命数据和寿命分布模型.结果表明,该加速寿命预测方法是合理且有效的,可为对电容器及相关产品寿命评估提供有益借鉴.
Research on the Accelerated Lifetime Prediction of Film Capacitors
In order to shorten the life assessment cycle and reduce the assessment costs of film capacitors with high-reliability and long-life,the accelerated life prediction method of film capacitors is studied.The temperature is selected as the accelerated stress to carry out the accelerated life test,and the pseudo life data is obtained by linear fitting of the test results according to the attenuation characteristics of capacitance.Based on the Arrhenius acceleration model and Weibull distribution model,the life data and life distribution model of film capacitors under ordinary temperature are obtained.The results show that the accelerated life prediction method is reasonable and effective,which can provide useful reference for the life assessment of capacitors and related products.

film capacitorslifetime predictionaccelerated test

童靓、李明峻、张弘、何东、徐文博、胡忠胜、桑满亮

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安徽赛宝工业技术研究院有限公司, 安徽 合肥 230011

芜湖赛宝信息产业技术研究院有限公司, 安徽 芜湖 241002

安徽飞达电气科技有限公司, 安徽 宣城 242300

薄膜电容器 寿命预测 加速试验

安徽省"揭榜挂帅"专项(2021)

2024

电子产品可靠性与环境试验
工业和信息化部电子第五研究所(中国电子产品可靠性与环境试验研究所) (中国赛宝实验室)

电子产品可靠性与环境试验

影响因子:0.438
ISSN:1672-5468
年,卷(期):2024.42(1)
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