首页|CSOP封装器件环境应力失效研究

CSOP封装器件环境应力失效研究

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陶瓷小外形封装(CSOP)器件在焊接到印制电路板(PCB)板上后,由于机械振动和温度环境变化应力的作用,容易出现引脚开裂问题.对CSOP封装器件引脚在应用验证阶段的失效现象进行分析,结果表明,通过引脚二次成型,增加引脚高度,提高引脚对温度冲击和振动应力的释放能力,能够显著提高CSOP、CQFP类表面贴装封装器件引脚的可靠性,保证器件能够满足较高的温度和机械应力要求.
Study on Environmental Stress Failure of CSOP Package Components
After the CSOP device is welded to the PCB board,the problem of pin cracking is easy to occur because of mechanical vibration and temperature environment change stress.The failure phenomenon of CSOP device pin in the application verification stage is analyzed.The results show that the reliability of CSOP and CQFP surface mount package device pin can be significantly improved and the device can meet the requirements of high temperature and mechanical stress by secondary pin forming,increasing the height of the pin and improving the ability of the pin to release temperature shock and vibration stress.

chip scale outline packagelead formingtemperature shockrandom vibrationsimulation

韩兆芳、王留所、卢礼兵

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中国电子科技集团公司第五十八研究所, 江苏 无锡 214072

陶瓷小外形封装 引脚成型 温度冲击 随机振动 仿真

2024

电子产品可靠性与环境试验
工业和信息化部电子第五研究所(中国电子产品可靠性与环境试验研究所) (中国赛宝实验室)

电子产品可靠性与环境试验

影响因子:0.438
ISSN:1672-5468
年,卷(期):2024.42(1)
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