Research on the Development of Reliability Technology for Automotive-grade Chip from Patent Perspective
In order to explore the development process and future trends of reliability technologies such as reliability testing,evaluation,and application verification of automotive-grade chip in China,and to more comprehensively understand the patent layout and future technological development direction of automotive-grade chip reliability testing technology,the Incopat patent search and analysis system is used to search for global reliability technology patents,and the retrieved patents are analyzed and studied in the four dimensions of application trends,technical fields,technical composition and efficacy,and applicants. The search results show that the number of patent applications for vehicle regulation reliability technology continues to rise,and the main application countries are China,South Korea,Japan,the United States,Germany,and the technical fields are mainly distributed in the G (physics),H (electricity) and B ( operation,transportation) . Furthermore,in response to the current situation of reliability technology patent applications in China,suggestions for patent layout are provided from the perspective of chip detection and testing projects.
万方数据
维普
