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系统级封装可靠性研究

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针对系统级封装(SiP)的结构特点和应用环境,设计和实施温度冲击试验来激发故障,并且通过X射线透视检查、切片和平面研磨检查、电子显微镜观察等手段对失效样品进行了分析.基于失效位置分布和相应的失效特征,明确失效机理为不同材料之间的热失配,确定了该SiP的热/机械应力可靠性薄弱点,为类似的SiP模块的可靠性增长提供了技术参考.
Research on the Reliability of System in Package
In response to the structural characteristics and application environment of system in package ( SiP),temperature shock test is designed and implemented to induce faults,and the failure samples are analyzed by X-ray inspection,sectioning and planar grinding inspection,electron microscope observation. Based on the failure location distribution and corresponding failure characteristics,the failure mechanism is identified as thermal mismatch between different materials,and the reliability weak point of thermal/mechanical stress of the SiP is identified,which provides technical reference for the reliability growth of the similar SiP modules.

system in packagereliabilityfailure analysisthermal mismatch

李冬、陈钊亿、曹振亚、苏社艳、赵鹏飞、唐辉

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中海油田服务股份有限公司,河北 廊坊 065201

工业和信息化部电子第五研究所,广东 广州 511370

中兴通讯股份有限公司,广东 深圳 518055

系统级封装 可靠性 失效分析 热失配

2024

电子产品可靠性与环境试验
工业和信息化部电子第五研究所(中国电子产品可靠性与环境试验研究所) (中国赛宝实验室)

电子产品可靠性与环境试验

影响因子:0.438
ISSN:1672-5468
年,卷(期):2024.42(5)