电子与封装2025,Vol.25Issue(1) :7-17.DOI:10.16257/j.cnki.1681-1070.2025.0008

微纳铜材料的制备及其在封装互连中的应用

Preparation of Micro-Nano Copper Material and Its Applications in Package Interconnection

彭琳峰 杨凯 余胜涛 刘涛 谢伟良 杨世洪 张昱 崔成强
电子与封装2025,Vol.25Issue(1) :7-17.DOI:10.16257/j.cnki.1681-1070.2025.0008

微纳铜材料的制备及其在封装互连中的应用

Preparation of Micro-Nano Copper Material and Its Applications in Package Interconnection

彭琳峰 1杨凯 1余胜涛 1刘涛 1谢伟良 1杨世洪 1张昱 1崔成强1
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作者信息

  • 1. 广东工业大学省部共建精密电子制造技术与装备国家重点实验室,广州 510006
  • 折叠

摘要

半导体器件的快速发展对封装互连材料提出了更高的要求.微纳铜材料具有良好的导电、导热和机械性能.与常用的微纳银相比,微纳铜具有更强的抗电迁移能力和更低的成本,在封装互连领域被广泛应用.微纳铜材料的制备方法可分为化学法、物理法、生物法3类,其中化学液相还原法以低成本、高可控、工艺简单等优势占据重要地位.不同的封装互连工艺步骤需要不同形貌的微纳铜颗粒.微纳铜材料在封装互连中主要应用于芯片固晶、Cu-Cu键合、细节距互连等工艺,探讨了微纳铜材料在以上工艺中的应用,并对微纳铜材料在封装互连中的应用进行了展望.

Abstract

The rapid development of semiconductor devices has put forward higher requirements for package interconnection materials.Micro-nano copper material has good electrical,thermal and mechanical properties.Compared with the commonly used micro-nano silver,micro-nano copper has stronger resistance to electromigration and lower cost,and micro-nano copper is widely used in the field of package interconnection.The preparation methods of micro-nano copper materials can be divided into three categories:chemical method,physical method,and biological method,among which the chemical liquid-phase reduction method occupies an important position with the advantages of low cost,high controllability,and simple process.Different package interconnection process steps require micro-nano copper particles with different morphologies.Micro-nano copper materials are mainly used in processes such as chip solidification,Cu-Cu bonding,and fine pitch interconnection in package interconnection,the applications of micro-nano copper materials in the above processes are discussed,and the applications of micro-nano copper materials in package interconnection are prospected.

关键词

微纳铜/化学液相还原法/封装互连

Key words

micro-nano copper/chemical liquid-phase reduction method/package interconnection

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出版年

2025
电子与封装
中国电子科技集团公司第五十八研究所

电子与封装

影响因子:0.206
ISSN:1681-1070
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