电子与封装2025,Vol.25Issue(1) :29-34.DOI:10.16257/j.cnki.1681-1070.2025.0001

适用于STT-MRAM的写电压产生电路设计

Write Voltage Generation Circuit Design for STT-MRAM

莫愁 王艳芳 李嘉威 陆楠楠
电子与封装2025,Vol.25Issue(1) :29-34.DOI:10.16257/j.cnki.1681-1070.2025.0001

适用于STT-MRAM的写电压产生电路设计

Write Voltage Generation Circuit Design for STT-MRAM

莫愁 1王艳芳 1李嘉威 1陆楠楠1
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作者信息

  • 1. 中国电子科技集团公司第五十八研究所,江苏无锡 214035
  • 折叠

摘要

自旋转移力矩随机磁存储器(STT-MRAM)是一种新型的非易失性存储器,在各行各业均具有广泛的应用前景.STT-MRAM使用磁隧道结(MTJ)器件来存储信息,写电压通常是零温度系数的,但MTJ的临界翻转电压具有负温度特性,高温时写电压与临界翻转电压相差较大,影响器件寿命,低温时写电压与临界翻转电压接近,甚至可能低于临界翻转电压,导致写入困难.针对MTJ的临界翻转电压的负温度特性,设计了一款宽温区温度自适应的写电压产生电路,在-40~125 ℃下为MTJ提供稳定的写电压,实现宽温度范围尤其是低温下数据的正常写入,并提高了高温下器件的寿命.经过后仿真验证,该电路在-40~125 ℃温度范围内均能实现MTJ成功写入,且写入电压与临界翻转电压的差值在100 mV左右.

Abstract

Spin transfer torque magnetic random access memory(STT-MRAM)is a new type of non-volatile memory with a wide range of applications in various industries.STT-MRAM uses magnetic tunnel junction(MTJ)devices to store information.The write voltage usually has zero temperature coefficient,but the critical flip-flop voltage of MTJ has a negative temperature characteristic,so the difference between the write voltage and the critical flip-flop voltage is large at high temperature,which affects the lifetime of the device,and at low temperature,the write voltage is close to,or may even be lower than the critical flip-flop voltage,which makes it difficult to write.Aiming at the negative temperature characteristic of the critical flip-flop voltage of MTJ,a wide temperature adaptive write voltage generator circuit is designed to provide stable write voltage for MTJ at-40-125 ℃,to realize the normal writing of data in wide temperature range,especially at low temperature,and to improve the lifetime of the device at high temperature.After post-simulation verification,the MTJ can be successfully written in the temperature range of-40-125 ℃,and the difference between the write voltage and the critical flip-flop voltage is about 100 mV.

关键词

自旋转移力矩随机磁存储器/磁隧道结/宽温区/温度自适应/写电压产生电路

Key words

spin transfer torque magnetic random access memory/magnetic tunnel junction/wide temperature/temperature adaptive/write voltage generation circuit

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出版年

2025
电子与封装
中国电子科技集团公司第五十八研究所

电子与封装

影响因子:0.206
ISSN:1681-1070
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