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一种应用于碳化硅全自动减薄机的定位巡边方法

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针对带平边的碳化硅晶片,在放到承片台上时,需要与承片台的平边重合,因此提出一种应用于碳化硅减薄机的定位巡边方法.此方法先在定位台上夹爪粗定位,然后旋转碳化硅晶片通过巡边传感器确定晶片的平边,最后旋转到设定的与承片台恰好重合的角度,完成定位巡边.此方法通过平边晶片与平边承片台的重合,使得吸附晶片的真空最大化,大大提升后续的磨削精度.通过磨削效果的对比,TTV由原来的 4.4 μm提升到 1.5 μm.
A Positioning and Edge Inspection Method Applied to Silicon Carbide Grinding Machines
For silicon carbide wafers with flat edges,they need to overlap with flat edges of wafer table when ware placed on.Therefore,a positioning and edge inspection method applied to silicon carbide grinding machines is proposed.This method first clamps the claw on the positioning platform for rough positioning,then rotates the silicon carbide chip to determine the flat edge of the chip through the edge detection sensor.Finally,it rotates to the set angle that exactly coincides with the carrier platform to complete the positioning and edge detection.This method maximizes the vacuum of the adsorbed wafer by overlapping the flat edge wafer with the flat edge wafer holder,greatly improving subsequent grinding accuracy.By comparing the grinding effects,TTV has increased from the original 4.4 μm up to 1.5 μm.

Silicon carbidePositioning and edge detectionGrinding accuracy

袁晓春、孙莉莉、王刚

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中国电子科技集团第四十五研究所,北京 100176

碳化硅 定位巡边 磨削精度

2024

电子工业专用设备
中国电子科技集团公司第四十五研究所

电子工业专用设备

影响因子:0.157
ISSN:1004-4507
年,卷(期):2024.53(2)