Orthogonal Experimental Design Based On Germanium Laser Labeling
In order to obtain laser labeling that is clear and does not damage the characteristics of the germanium wafer,this paper uses the orthogonal experimental design method to perform DOE and range analysis on the average output power value of the laser,pulse laser frequency,and marking speed of the chip. Through range analysis,the primary and secondary relationships of the four influencing factors were obtained as follows: laser generator power value>marking speed>laser frequency>blank (other factors). The optimal formula for obtaining the marking depth is the marking speed of 200 mm/s,the average output power of the laser generator is 46％,and the pulse laser frequency is 18 kHz. At this point,the marking depth is 230 μm.
Germanium waferLaser labelingOrthogonal experimental designOutput power
万方数据
维普
