首页|Bi2(Se0.53Te0.47)3纳米线的制备及其圆偏振光致电流效应

Bi2(Se0.53Te0.47)3纳米线的制备及其圆偏振光致电流效应

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采用化学气相沉积法制备Bi2(Se0.53Te0.47)3 纳米线,利用扫描电子显微镜和X射线能谱仪对其进行表征,并研究样品的圆偏振光致电流效应(circular photogalvanic effect,CPGE).利用1064 nm激光激发,分别测试激光入射面垂直于纳米线和平行于纳米线时的CPGE电流.实验结果表明,测得的CPGE电流主要来自纳米线的拓扑表面态.激光垂直入射纳米线时的CPGE电流不为 0,说明CPGE电流来源于纳米线能带的六角翘曲效应.本研究测得的Bi2(Se0.53Te0.47)3 纳米线的CPGE电流比文献报导的Bi2(Te0.23Se0.77)3 纳米线增大 2 倍以上,这是因为Te组分的增加不但使得费米能级更加靠近狄拉克点,还降低了纳米线中载流子复合的概率,二者共同作用,使得CPGE电流增大.
Preparation of Bi2(Se0.53Te0.47)3 nanowires and their circular photogalvanic effect
Bi2(Se0.53Te0.47)3 nanowires were prepared by chemical vapor deposition,characterized by scanning electron microscopy and X-ray energy dispersive spectroscopy,and the circular photogalvanic effect(CPGE)of the samples were investigated.Using 1 064 nm laser excitation,the CPGE current is measured when the incident plane of laser is perpendicular to and parallel to the nanowires.The experi-mental results show that the measured CPGE current mainly comes from the topological surface states of the nanowires.The CPGE current is not zero when the laser vertically incident the nanowires,indicating that the CPGE current comes from the hexagonal warping effect of the energy band in nanowires.The CPGE current of the Bi2(Se0.53Te0.47)3 nanowires measured in this investigation is more than two times larger than that of the Bi2(Se0.23Te0.77)3 nanowires reported in literature.This is because the increase of Te component not only makes the Fermi level closer to the Dirac point,but also reduces the probability of carrier recombination in the nanowires.The two work together to increase the CPGE current.

Bi2(Se0.53Te0.47)3 nanowirestopological insulatorchemical vapor depositioncircular photogalvanic effect

冯世尊、俞金玲

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福州大学物理与信息工程学院,福建 福州 350108

Bi2(Se0.53Te0.47)3纳米线 拓扑绝缘体 化学气相沉积 圆偏振光致电流效应

国家自然科学基金资助项目福建省对外合作资助项目

620740362019I0005

2024

福州大学学报(自然科学版)
福州大学

福州大学学报(自然科学版)

CSTPCD北大核心
影响因子:0.35
ISSN:1000-2243
年,卷(期):2024.52(1)
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