Research on Life Test and Evaluation Technology of Power Supply Board of EMUs Based on Accelerated Degradation
The AVR6 power board basic function was introduced with in-depth analysis of the performance parameters and sensitive stress, and power board enhancement test project and test frofile were proposed; Through strengthening power board stress test to explore the key parameters stress limit condition, the power supply board stress accelerated degradation test combined scheme and test sample size was proposed and implemented;with the analysis of test data, the power supply board pseudo life and multi stress accelerated degradation model was presented;and by using MLE estimation and covariance matrix, a comprehensive assessment of the reliability and lifetime level of power board was carried out, which provided a basis for improving products reliability and developing maintenance cycle.
EMUselectronic single boardreliabilityintensified testlifeaccelerated degradation test
NETL
NSTL
万方数据
维普
