首页|基于发射率修正模型的红外测温补偿方法

基于发射率修正模型的红外测温补偿方法

An Infrared Temperature Measurement Compensation Method Based on Emissivity Correction Model

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红外测温由于受到被测物体表面发射率的影响,温度测量结果存在一定误差.通过分析表面粗糙度对表面红外发射率的影响,提出一种基于发射率修正模型的红外测温补偿方法.首先,基于红外测温原理,建立针对表面粗糙度修正的红外测温补偿算法;其次,为确定红外测温补偿方法中表面发射率修正,通过双尺度粗糙表面建立粗糙表面发射率修正模型;最后,为验证提出红外测温补偿方法的可行性,在搅拌摩擦焊焊缝红外测温实验中对比了补偿算法前后测量结果,结果表明:红外测温最大误差由2.783 ℃降低为1.058℃,平均测量误差由1.683℃降低为0.649℃,验证了所提出的红外测温补偿方法可以提高红外测温精度.
At present,the infrared temperature measurement method is affected by the surface emissivity of the measured object,which makes the measurement results have errors.By analyzing the influence of surface roughness on surface infrared emissivity,an infrared temperature compensation method based on emissivity correction model is proposed.Firstly,an infrared temperature compensation algorithm for surface roughness correction is established based on the principle of infrared temperature measurement.Secondly,in order to determine the surface emissivity correction in the infrared temperature compensation method,a rough surface emissivity correction model is established by two-scale rough surface.Finally,in order to verify the feasibility of the proposed infrared temperature measurement compensation method,the measurement results before and after the compensation algorithm are compared in the infrared temperature measurement experiment of friction stir welding seam.The maximum error of infrared temperature measurement is reduced from 9.64 ℃ to 2.97 ℃,and the average measurement error is reduced from 3.57 ℃ to 0.71 ℃,indicating that the proposed infrared compensation temperature measurement method can improve the accuracy of infrared temperature measurement.

infrared temperature measurementemissivity correctionsurface roughnesstwo-scalefriction stir welding seam

米松涛、张玉存、付献斌、颜方、孔涛

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燕山大学,河北秦皇岛 066300

河北环境工程学院,河北秦皇岛 066300

红外测温 发射率修正 表面粗糙度 双尺度 搅拌摩擦焊焊缝

中央政府引导地方科学技术发展基金中央政府引导地方科学技术发展基金河北省自然科学基金河北省自然科学基金

216Z801G226Z1806GE2022415005E20211415003

2024

计量学报
中国计量测试学会

计量学报

CSTPCD北大核心
影响因子:0.303
ISSN:1000-1158
年,卷(期):2024.45(2)
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