Research on Heavy Ion Irradiation Test Method for Single Event Effects of Virtex-5 SRAM FPGA
To address the problem that SRAM FPGA is prone to single event effect(SEE)in space radiation environment,which may affect the normal operation of space borne electronic equipment or even lead to functional interruptions,a research on the ground irradiation test method of SRAM FPGA's SEE was conducted.The single event upset(SEU)test method of CRAM and BRAM was proposed.The test system was designed using the Xilinx Virtex-5 series industrial-grade SRAM FPGA as the test object,and the heavy ion irradiation test was carried out.The device,s single event latch-up(SEL)test data and the SEU test data of CRAM,BRAM,and the typical user circuits before and after TMR were obtained.Finally,the SEU rate was analyzed using space environ-ment simulation software.Based on the CREME96 model.the SEU probability of CRAM of XC5VFX130T in GEO orbit was calcu-lated to be 6.41 × 10-7 times/bit·day.
SRAM FPGAsingle event effectssingle event upsetsingle event latch-upheavy ion irradiation test
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