Research on NorFlsah Functional Verification System Based on FSMC Technology
廖勇 1张思佳 2李佳俊 1韦纯进 1吴佩雯 1张亭亭1
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作者信息
1. 航天科工防御技术研究试验中心,北京 100854
2. 西南石油大学电气信息学院,成都 610500
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摘要
针对闪存存储器NorFlash而言,其功能验证与参数测试主要依赖于集成电路自动测试机(ATE,automatic test equip-ment),采用ATE进行测试程序开发时存在测试向量编写困难、测试程序编写流程复杂、ATE机时占用时间长等不足,通过研制一款基于可变静态存储控制器(FSMC,flexible static memory controller)技术的NorFlash功能验证装置,在功能验证时可以实现NorFlsah测试向量的地址动态递增和数据动态添加,时序设置简单,从而减少开发周期和难度,同时释放ATE机时占用;并且可广泛外接各类型高精度源表设备进行部分交直流参数的测试;在板级模拟NorFlsah实际工作条件进行验证测试所得到的功能验证效果与测试数据均符合芯片手册要求,为后续此类存储芯片的选用与评估提供可靠的试验支撑.
Abstract
For flash memory NorFlash,its function verification and parameter testing mainly rely on integrated circuit automatic test equipment(ATE).When the ATE is used for the development of test programs,there are the shortcomings of difficultly writing test vectors,complex testing process,and long runtime occupation by the ATE.Therefore,a NorFlash function verification device based on flexible static memory controller(FSMC)is developed,which can realize the dynamic address increment and data addition of NorFlsah test vector during the function verification.The sequence setting is simple,thus reducing the development cycle and difficul-ty,and releasing the occupied time of the ATE machine;various types of high-precision source table equipment can be widely connect-ed to test the partial parameters of alternating current and direct current;The functional verification results and test data obtained by simulating the actual working conditions of NorFlsah at the board level are in line with the requirements of the chip manual,which provides a reliable test support for the subsequent selection and evaluation of memory chips.
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