首页|基于XC7V690T的在轨抗单粒子翻转系统设计

基于XC7V690T的在轨抗单粒子翻转系统设计

扫码查看
针对核心工业级SRAM型FPGA芯片XC7V690T抗辐照能力较弱、在轨运行期间存在较高单粒子翻转风险的问题,为了提高XC7V690T在轨抗单粒子翻转的能力及配置文件注数修改的灵活性,设计了一种基于XC7V690T的在轨抗单粒子翻转系统架构;其硬件架构主要由XC7V690TSRAM型FPGA芯片、AX500反熔丝型FPGA芯片以及多片FLASH组成;软件架构主要包括AX500反熔丝型FPGA对XC7V690T进行配置管理及监控管理,对XC7V690T进行在轨重构管理,XC7V690T通过调用内部SEM IP核实现对配置RAM资源的自主监控和维护;在轨实验结果表明,采用工业级SRAM型FPGA芯片XC7V690T的某航天器通信机在轨测试过程中成功进行了 SEM纠错,通信机在轨工作正常,通信链路稳定,满足使用要求,表明该系统架构可以有效提升XC7V690T抗单粒子翻转能力,可以为其他SRAM型FPGA抗单粒子翻转设计提供借鉴与参考。
System Design of On-orbit Anti-SEU Based on XC7V690T
Aiming at the problem that the core industrial SRAM-based field programmable gate array(FPGA)chip XC7V690T has the weak anti-irradiation capability and risk of single-event upsets(SEU)during the periods of on-orbit operation,in order to im-prove the on-orbit anti-SEU capability of industrial SRAM-based FPGA chip XC7V690T and the flexibility of configuration file for modification,an on-orbit anti-SEU system architecture based on XC7V690T chip is designed.The hardware architecture is mainly composed of XC7V690T SRAM-based FPGA chip,AX500 anti-fuse FPGA chip and multiple FLASH chips.The software architec-ture mainly includes XC7V690T chip configuration management and monitoring management on AX500 anti-fuse FPGA,the autono-mous monitoring and maintenance on configuration RAM resource are achieved in XC7V690T chip by calling the inner core soft error mitigation(SEM)IP On-orbit test verification results show that based on industrial SRAM-based FPGA chip,the SEM error correc-tion of the spacecraft communicator is carried out successfully during the periods of on-orbit operation,and the spacecraft communica-tor is running normally in orbit,the communication link is stable,which meets the need of application,the test results show that the system architecture can effectively improve the anti-SEU capability of XC7V690Tchip,which can provide a reference of anti-SEU de-sign for other SRAM-based FPGA.

FPGASEUSEMtriple modular redundancy(TMR)scrubbing

夏俊、张嘉伟、孙晨、朱昶文、江亚州

展开 >

上海卫星工程研究所,上海 201109

上海航天电子技术研究所,上海 201109

现场可编程门阵列 单粒子翻转 软错误缓解 三模冗余 刷新

2024

计算机测量与控制
中国计算机自动测量与控制技术协会

计算机测量与控制

CSTPCD
影响因子:0.546
ISSN:1671-4598
年,卷(期):2024.32(3)
  • 20