摘要
二维材料及其范德华异质结构具有极其丰富的力学、电学、光学、磁学等新奇物性,呈现出丰富的物理内涵并具有潜在的应用.二维材料中掺杂、转角、缺陷态等内在状态以及介电常数、应力、电磁场等外在环境通常具有纳米尺度的不均匀性,并能深刻影响其物性及相应纳米器件的性能,故而深入探测二维材料的新奇物性并揭示背后的物理起因,往往需要纳米尺度的表征手段.原子力显微镜及衍生的各种力学、电学、光学和磁学等先进原子力显微技术能够在纳米尺度测量二维材料的结构和物性并探究构效关系.本文首先介绍了基于原子力显微镜的纳米力学、纳米电学、纳米光学、纳米磁学和纳米加工模式的基本原理,然后总结了这些先进原子力显微术在表征二维材料新奇物性中的应用研究进展,最后展望了未来先进原子力显微术的革新方向和发展潜力.
Abstract
Two-dimensional(2D)materials and their van der Waals heterostructures exhibit extremely rich mechanical,electrical,optical,magnetic and other novel physical properties,presenting abundant physics and potential applications.The intrinsic states of 2D materials,such as doping,twisting,and defect states,as well as the external environment,such as dielectric constant,stress,and electromagnetic fields,usually exhibit nanoscale heterogeneity,which can deeply affect their physical properties and corresponding nanodevice performance.Therefore,in-depth exploration of the novel properties of 2D materials and revealing the physical origins behind them often require nanoscale characterization techniques.Advanced atomic force microscopy(AFM)techniques,including nano-mechanical,nano-electrical,nano-optical,nano-magnetic and nano-etching modes,can measure the unique structures and novel properties of 2D materials at the nanoscale and investigate the structure-property relationships.In this paper,we first introduce the basic principles of AFM-based nano-mechanical,nano-electrical,nano-optical,nano-magnetic and nano-etching modes.We then summarize the research progress of these advanced AFM techniques in characterizing the novel properties of 2D materials.This nanoscale multi-dimensional characterization and manipulation technology has played a key role in promoting basic research and applied technologies based on 2D materials.Finally,we prospect the future innovative directions and development potential of advanced AFM techniques.Firstly,advanced AFM utilizing 2D quantum materials as the tip will continue to emerge in the future,opening up new windows for measuring the quantum properties of 2D materials.Secondly,combining ultrafast optical spectroscopy with near-field optics can realize ultrafast scanning near-field optical microscopy,providing new insights into the structure-property relationships and electron dynamics in 2D materials.Thirdly,emerging advanced AFM can simultaneously measure and image the mechanical,optical,and electrical properties of 2D materials at the nanoscale,improving the measurement efficiency and accuracy for the study of complex material systems.Lastly,machine learning will enable AFM platforms to have automated operational capabilities and precise data analysis abilities in the study of various 2D materials.These continually improving and evolving advanced AFM techniques will play a greater role in characterizing the novel properties of 2D materials and other interfacial systems.
基金项目
中央高校基本科研业务费专项资金(2042022kf1060)
维普
万方数据