Variation of Leaf Epidermal Conductance of Winter Wheat Cultivars and Its Correlation with Some Morpho-physiological Characters of Leaf
Leaf epidermal conductance is closely related with dehydration tolerance and water use efficiency in crops, thus it has important value in drought-resistant breeding. Eight wheat cultivars which were widely planted in the last 50 years in Guanzhong area of Shaanxi province were used to test the degree of genotypic variation in epidermal conductance and its correlation with some morpho-physiological characters of leaf. The results indicated that the epidermal conductance of the eight wheat cultivars were ranged between 21.2～30.8 mmol · m-2 · s-1 at booting stage,Il. 9～23.2 mmol · m-2 ·s-1 at grain-filling stage, respectively. Leaf epidermal conductance at grain-filling stage was lower than that at booting stage. Drought resistant cultivar Changwu 134 had lower epidermal conductance than other cultivars. No significant difference in epidermal conductance was detected at booting stage,but extremely significant difference observed at grain-filling stage. Leaf epidermal conductance of wheat was positively related with leaf area and abaxial stomata width, and negatively related with wax load at booting stage. Epidermal conductance of wheat leaf was not related with leaf morphological traits, wax load and stomatal traits at grain-filling stage, indicating different mechanisms may involve in the variation of wheat leaf epidermal conductance at booting and grain-filling stage.
NETL
NSTL
万方数据
维普
