利用90K基因芯片进行小麦株高QTL分析
QTL Analysis of Plant Height by Using 90K Chip Technology
武炳瑾 1冯洁 1崔紫霞 1张传量 1孙道杰1
作者信息
- 1. 西北农林科技大学农学院,陕西杨凌 712100
- 折叠
摘要
为给小麦株高标记辅助选择提供可供选择的分子标记,并进一步对株高QTL进行精细定位及相关基因克隆,以小麦骨干亲本周8425B和小偃81衍生的包含102个家系的RIL群体(F8)为材料,利用90K芯片标记构建高密度遗传图谱,在3个环境下对株高进行QTL检测.结果表明,所构建的图谱含有9290个SNP标记,覆盖了小麦21条染色体的63个连锁群,图谱总长3894.64 cM,平均标记密度为0.42 cM.共检测到9个控制株高的QTL,分布于1B、4A、4D、6B、7A、7B和7D染色体上,变异解释率为2.23％～16.25％.QPh.nafu.4D、QPh.nafu.4A、QPh.nafu.1B-2与前人定位到的位置相同或相近.QPh.nafu.7A具有较大的LOD值(8.17)和变异解释率(14.69％),为主效QTL.QPh.nafu.6B、QPh.nafu.7B-1、QPh.nafu.7B-2均能在多个环境下使用多种QTL检测方法定位到,可能为新的较稳定的控制株高的QTL.
Abstract
Molecular marker assisted breeding of wheat provides a reference for fine mapping and cloning of plant height genes.In the present study,a population of 102 recombinant inbred lines (F8)was derived from a cross between the elite parents Zhou 8425B and Xiaoyan 81.The population was used to identify quantitative trait loci (QTL) in three environments.A high density genetic map of wheat was constructed by using 90K chip.The constructed genetic linkage map contains 9 290 SNP markers,with a total length of 3 894.64 cM,containing 63 linkage groups and covering the 21 chromosomes of wheat,with an average marker density of 0.42 cM.A total of nine QTLs controlling plant height were found on 1B,4A,4D,6B,7A,7B and 7D chromosomes.The amount of phenotype variation explained (PVE) by individual QTL ranged from 2.23％ to 16.25％.QPh.nafu.4D,QPh.nafu.4A and QPh.nafu.1B-2 have the same or similar position with the findings in previous studies.QPh.nafu.7A have a high value of LOD (8,17) and PVE (14.69％),which may become a main effect QTL.QPh.nafu.6B,QPh.nafu.7B-1 and QPh.nafu.7B-2 can be detected in multi-environments and methods,which may become the new stable QTLs controlling plant height.
关键词
小麦/90K基因芯片/QTL定位/株高Key words
Wheat/90K gene chip/QTL mapping/Plant height引用本文复制引用
基金项目
国家重点基础研究发展计划(973计划)项目(2014CB138100)
陕西省重点科技创新团队项目(2014KCT-25)
出版年
2017
国家科技期刊平台
NSTL
维普
万方数据