QTL Mapping for Kernel-Related Traits from Synthetic Hexaploid Wheat Lines
As a crucial genetic resource,synthetic hexaploid wheat plays a key role in studying of ker-nel-related traits.In order to further explore the quantitative trait loci(QTL)of kernel-related traits in wheat,a RIL population consisting of 154 lines derived from a cross between XN389 and a synthetic hexaploid wheat(KU2098)was used as materials.Wheat 55K SNP array was used to construct the genetic map and QTLs for nine kernel-related traits were identified,including kernel length(KL),kernel width(KW),kernel area(KA),kernel perimeter(KP),kernel length width ratio(KLWR),thousand-kernel weight(TKW),kernel protein content(KPC),SC(starch content)and wet gluten content(WGC).A total of 84 additive QTLs were identified across 21 wheat chromosomes,except for chromosome 7B.The individual QTL explained the phenotypic variation from 0.91%to 43.41%,with LOD values ranging from 2.54 to 39.96.Among them,31 major and 10 stable QTLs were iden-tified.A total of twelve QTL clusters,encompassing QTLs associated with kernel-related traits,were identified on chromosomes 1A(1),1B(1),1D(1),2D(1),4D(1),5A(1),5D(1),6A(2),6B(2)and 7D(1).In the corresponding physical interval of QTL cluster C8,two candidate genes re-lated to kernel traits were identified.Four candidate genes related to quality traits were identified in physical region of QTL cluster C3.The QTLs can provide reference for yield and quality improvement of wheat.