Effects of low-temperature stress on root system characteristics and electric conductivity of maize seedlings
Low temperature during the seedling period is one of the main limiting factors for high and stable yield of maize in Heilongjiang Province.To address the effect of low temperature on the growth of seedling root,three maize cultivars Zhengdan 958 (cold resistance type),Xianyu 335 (middle type),and Fenghe 1 (sensitivity type) were investigated at diurnal temperature of 20 ℃/11 ℃ (CK),18 ℃/9 ℃,16 ℃/7 ℃,14 ℃/5 ℃ for2,4,6,8,10 days.The root characteristics and root electric conductivity after low temperature treatment were studied.The results showed that with increasing the temperature stress,the growth rates of root dry weight,length,surface area,and dry weight density decreased,the electric conductivity increased,and the roots almost stopped growing at 5 ℃.The inhibitory effects of low temperature on the growth and cell membrane permeability of roots of the three cultivars were in order of Fenghe 1 ＞ Xianyu 335 ＞ Zhengdan 958.The results indicated that low temperature could inhibit the growth of roots,while increase the cell membrane permeability of roots.Cold resistance cultivars showed better root growth,more stable root plasma membrane system with a lower permeability.
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