Study on the Radiation-Induced Sample Damage in X-Ray Photoelectron Spectroscopy
High energy X-ray irradiation can cause physicochemical changes on the surface of some samples,causing in the obtained X-ray photoelectron spectroscopy(XPS)data cannot truly give feedback to the physicochemical state of the sample surface in the process of XPS analysis.Clarifying the influence and rules of X-ray on the physicochemical properties of the sample surface is the key to accurately obtaining XPS data.Herein,a variety of representative materials are selected to obtain the XPS analysis results under continuous X-ray irradiation,and the effect of X-ray on the physicochemical state of the sample surface is explored.The results reveal that X-ray could cause surface physical burns,thermal decomposition,destroying unstable chemical bonds,and even inducing reduction reactions for specific samples.The regularity of the influence of X-rays on the physicochemical states of the sample surface during XPS analysis and the method of reducing the influence of X-rays on the analysis results are described,which provides a theoretical support for efficient and accurate acquisition of XPS data.
万方数据
维普
