Junction temperature estimation and aging monitoring method of IGBT module based on transfer function
The Cauer model of insulated gate bipolar transistor(IGBT)module is closely related to reliability.Therefore,it is great practical significant to study the Cauer model and its parameter extraction method.Based on this,taking the third-order Cauer model as an example,this paper studies the parameter extraction method of thermal network model based on the base plate temperature transfer function,and uses the model to realize accurate estimation of junction temperature and aging condition monitoring.Firstly,the relationship between the base plate temperature transfer function and the parameters of the thermal network model is established,and the thermal resistance and heat capacity of the third-order Cauer frequency domain model are determined.Secondly,the junction temperature transfer function is deduced according to the obtained third-order Cauer frequency domain model,and then the junction temperature expression is obtained to realize the junction temperature estimation of IGBT module,and its accuracy is verified by experiments.Finally,compared with international electrotechnical commission(IEC)standard calculation method of total thermal resistance,the calculation error is less than 1%,and the accurate estimation of junction temperature is realized.In addition,based on this method,the condition monitoring of IGBT module,thermal interface material(TIM)and heat dissipation effect of heat sink can be realized.
insulated gate bipolar transistorCauer frequency domain modeltransfer functionjunction temperature estimationcondition monitoring
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