Green Patent Metrology Research Based on Location Quotient Method under the Background of Double Carbon
The article conducts a quantitative analysis of China's green patents based on the green technology fields classified by WIPO.Using Patentsight software,various factors affecting patents are standardized(normalized)to eliminate the dimensional influence between indicators.By introducing the location entropy index,enriching the patent literature analysis index system,this paper explores the concentration level of China's green patents,extracts the hotspots and future development directions of green patent technology,proposes strategies for the development of green patents,including strengthening policy guidance,improving intellectual property protection systems,focusing on collaborative research and development of green patents.
Green patentPatent metrologyCarbon emissionsDouble carbonLocation quotient
万方数据
维普
