基于正交算法的车规级芯片耦合故障研究
Research on Coupling Fault of Automotive Gauge Level Chip Based on Orthogonal Algorithm
张胜强 1李明阳 1翟瑞卿 1李帅东 2李予佳1
作者信息
- 1. 中国汽车技术研究中心有限公司,天津 300163
- 2. 南开大学 网络空间安全学院,天津 300071
- 折叠
摘要
从汽车芯片信息安全角度出发,由于汽车安全芯片工作主要受环境中的电磁、电压和光的影响,在阐明了电磁、电压和光对安全芯片的影响原理的基础上,综合考虑影响芯片工作的三种因素和因素间的相互作用,提出了多维组合的车规级安全芯片故障注入测试技术.以典型安全芯片为例,对其进行电磁操纵、电压操纵、光注入以及三者的组合注入,比较故障注入前后安全芯片加密解密得到的密文或明文,从而能够得出安全芯片的安全性结论.
Abstract
From the perspective of cyber security of automotive chips,the operation of automotive encryption chips is mainly influenced by the electromagnetic,voltage and light in the environment.Based on elucidating the principle of the influence of electromagnetic,voltage and light on encryption chips,this paper considers the three factors and their interactions,and proposes a multi-dimensional combination of automotive gauge level encryption chip fault injection testing technology.Taking a typical encryption chip as an example,by performing electromagnetic manipulation,voltage manipulation,optical injection,and a combination of the three,the encrypted or plaintext obtained by encrypting and decrypting the encryption chip before and after fault injection is compared,and the security conclusion of the encryption chip is drawn.
关键词
故障注入/信息安全/车规级/安全芯片Key words
fault injection/cyber security/automotive gauge grade/encryption chip引用本文复制引用
出版年
2024
国家科技期刊平台
NSTL
万方数据