首页|Observation of ballistic-diffusive thermal transport in GaN transistors using thermoreflectance thermal imaging
Observation of ballistic-diffusive thermal transport in GaN transistors using thermoreflectance thermal imaging
扫码查看
点击上方二维码区域，可以放大扫码查看
原文链接
NETL
NSTL
万方数据
Zhi-Ke Liu、Yang Shen、Han-Ling Li、Bing-Yang Cao
展开 >
Key Laboratory for Thermal Science and Power Engineering of Ministry of Education,Department of Engineering Mechanics,Tsinghua University,Beijing 100084,China
National Natural Science Foundation of ChinaNational Natural Science Foundation of ChinaNational Natural Science Foundation of China
NETL
NSTL
万方数据
