首页|High-current pulsed electron beam modification on microstructure and performance of Cu/CuW diffusion bonding joints

High-current pulsed electron beam modification on microstructure and performance of Cu/CuW diffusion bonding joints

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This study investigates the influence of high-current pulsed electron beam(HCPEB)modification on the microstructure and shear strength of Cu/CuW joints.Reliable solid-state diffusion bonding of modified-Cu(M-Cu)and modified-CuW(M-CuW)was achieved by HCPEB modification pretreatment at a temperature of 800-900 ℃ and a pressure of 5 MPa for 10-50 min.Experiments demonstrate that HCPEB modification facili-tates the dissolution of W and Cu,resulting in the forma-tion of a Cu0.4W0.6 solid solution and thus enhancing the uniform distribution of microstructures.Additionally,HCPEB-induced defects play a beneficial role in promoting the diffusion process by providing fast diffusion paths for elements.The optimal joints with the maximum shear strength of 213.7 MPa were obtained through bonding M-Cu and M-CuW at 900 ℃ and 5 MPa for 30 min,which attributes to the combined effects of fine-grained strengthening and solid solution strengthening.Overall,the application of HCPEB modification showcases its effec-tiveness in promoting element diffusion and enhancing the mechanical performance of the joints.

HCPEBElement diffusionShear strengthCrystal defectsSurface modification

Na-Na Tian、Cong-Lin Zhang、Peng Lyu、Jin-Tong Guan、Jie Cai、Qing-Feng Guan、Shun Guo

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School of Materials Science and Engineering,Jiangsu University,Zhenjiang 212013,China

School of Material Science and Engineering,Yancheng Institute of Technology,Yancheng 221051,China

Engineering Institute of Advanced Manufacturing and Modern Equipment Technology,Jiangsu University,Zhenjiang 212013,China

国家自然科学基金江苏省自然科学基金

52001273BK20201062

2024

稀有金属(英文版)
中国有色金属学会

稀有金属(英文版)

CSTPCDEI
影响因子:0.801
ISSN:1001-0521
年,卷(期):2024.43(6)
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