Abstract
Two-dimensional materials are widely consid-ered to be highly promising for the development of pho-todetectors.To improve the performance of these devices,researchers often employ techniques such as defect engi-neering.Herein,pressure is employed as a clean and novel means to manipulate the structural and physical properties of EuSbTe3,an emerging two-dimensional semiconductor.The experimental results demonstrate that the structural phase transformation of EuSbTe3 occurs under pressure,with an increase in infrared reflectivity,a band gap closure,and a metallization at pressures.Com-bined with X-ray diffraction(XRD)and Raman charac-terizations,it is evident that the pressure-driven transition from semiconductor Pmmn phase to metallic Cmcm phase causes the disappearance of the charge density wave.Furthermore,at a mild pressure,approximately 2 GPa,the maximum photocurrent of EuSbTe3 is three times higher than that at ambient condition,suggesting an untapped potential for various practical applications.