X射线衍射技术中噪声波动对微量物相鉴定的影响
Effect of noise fluctuation on trace phase identification in X-ray diffraction technique
陈河 1王春建 2徐家坤 1肖寒 1李敬民3
作者信息
- 1. 昆明理工大学材料科学与工程学院,云南昆明 650093
- 2. 昆明理工大学材料科学与工程学院,云南昆明 650093;昆明理工大学分析测试研究中心,云南昆明 650093
- 3. 莱德福科技有限公司,云南昆明 650093
- 折叠
摘要
论文重点研究了X射线衍射(XRD)技术背景噪声在微量物相鉴定过程中的影响.结果表明:背景噪声可划分为噪声大小和噪声波动两部分,噪声波动可进一步细分为波峰、波谷、平台3种类型;利用噪声波动的比对情况,依然可以对微量物相开展3强线、5强线等比对分析,并确认微量物相组成.在此基础上,论文对微量CaCO3物相提供的微弱衍射信号开展了定性表征,发现除了CaCO3物相卡片(PDF# 00-047-1743)中的3强线、5强线、甚至8强线均可与背景噪声中的波峰或平台类型一一比对外,其他物相卡片的较强衍射线均无法达到"都与波峰或平台一一 比对"的情况,这一结果较好地验证了背景噪声在物相鉴定分析中的作用.
Abstract
The influence of background noise on trace phase identification in X-ray diffraction(XRD)was focused in this study.The results showed that background noise could be divided into two parts:noise am-plitude and noise fluctuation.The noise fluctuation could be further classified into three types:peaks,val-leys,and platforms.According to the comparison of noise fluctuation,it was still possible to carry out match analysis using 3 strongest lines,5 strongest lines,and so on of trace phase cards and confirm trace phase composition.On the basis of this,weak diffraction signals provided by trace CaCO3 phase was quali-tatively characterized.It was found that 3 strongest lines,5 strongest lines,even 8 strongest lines in Ca-CO3 phase card(PDF # 00-047-1743)were one-to-one matched with peaks or platforms of background noise,and the notable diffraction lines in other phase cards could not meet"one-to-one matched with the peaks or platforms".The results well verified the role of background noise in trace phase identification and analysis.
关键词
X射线衍射(XRD)/背景噪声/噪声波动/信噪比/定性分析/物相鉴定Key words
X-ray diffraction(XRD)/background noise/noise fluctuation/signal-to-noise ratio/qualitative analysis/phase identification引用本文复制引用
出版年
2024
NETL
NSTL
万方数据