Effect of noise fluctuation on trace phase identification in X-ray diffraction technique
The influence of background noise on trace phase identification in X-ray diffraction(XRD)was focused in this study.The results showed that background noise could be divided into two parts:noise am-plitude and noise fluctuation.The noise fluctuation could be further classified into three types:peaks,val-leys,and platforms.According to the comparison of noise fluctuation,it was still possible to carry out match analysis using 3 strongest lines,5 strongest lines,and so on of trace phase cards and confirm trace phase composition.On the basis of this,weak diffraction signals provided by trace CaCO3 phase was quali-tatively characterized.It was found that 3 strongest lines,5 strongest lines,even 8 strongest lines in Ca-CO3 phase card(PDF # 00-047-1743)were one-to-one matched with peaks or platforms of background noise,and the notable diffraction lines in other phase cards could not meet"one-to-one matched with the peaks or platforms".The results well verified the role of background noise in trace phase identification and analysis.
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