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载板BT材料沉铜孔破问题研究

Research on the electroless plating void of the BT resin substrate

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BT树脂基板由于良好的稳定性和高可靠性,广泛应用在封装载板领域.与传统FR-4材料不同,BT材料在化学沉铜加工过程中容易产生沉铜不良导致孔破问题,影响产品品质.通过实验分析和验证,从载板材料类型、沉铜工艺参数和除胶参数等分析对沉铜孔破的影响,最终总结出有效改善载板BT材料孔破问题的有效措施.
Bismaleimide triazine(BT)resin substrates are widely used in the field of integrated circuit(IC)substrate due to their good dimension stability and high reliability.Unlike the traditional FR-4,the special properties of BT resin can cause quality issues such as poor coverage during electroless plating.This paper analyzes and verifies the factors affecting poor coverage from multiple perspectives,including substrate material type,elcetroless plating parameters,and desmear parameters.Based on the analysis and verification,improvement measures and right directions are summarized,effectively improving the electroless void defect.

electroless platingBT resinvoiddeposition rate

程骄、朱运乐、王俊

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景旺电子科技(珠海)有限公司,广东 珠海 519000

珠海市5G通信和汽车高端印制电路板工程技术研究中心,广东 珠海 519000

沉铜 BT材料 孔破 沉积速率

2024

印制电路信息
中国印制电路行业协会

印制电路信息

影响因子:0.243
ISSN:1009-0096
年,卷(期):2024.32(11)