首页|高压大功率IGBT器件绝缘结构的电场计算研究综述

高压大功率IGBT器件绝缘结构的电场计算研究综述

扫码查看
随着高压直流输电技术的发展,高压大功率绝缘栅双极型晶体管(insulated gate bipolar transistor,IGBT)器件被广泛应用于各类高压大容量电力换流和控制装备中.然而,在高压大功率IGBT器件的研制过程以及工程应用中,器件内部局部放电现象乃至击穿现象频繁发生,给器件绝缘设计带来巨大挑战.要想实现良好器件绝缘设计,就需要获得器件内部的电场分布,因此实现器件内部电场的准确计算至关重要.文中全面回顾器件内部绝缘结构的建模和计算方法的发展历程,从封装绝缘电场计算、芯片绝缘电场计算以及芯片和封装绝缘耦合电场计算3个方面介绍相关研究的发展历程、适用范围以及相应的不足,最后展望未来器件内绝缘结构电场计算的发展方向.
Review on the Electric Field Calculation of Insulation Structure of High-voltage and High-power IGBT Device
With the development of high voltage direct current transmission technology,high-voltage and high-power insulated gate bipolar transistor(IGBT)devices are widely used in various high-voltage and high-capacity power converters and control equipment.However,during the development of high-voltage and high-power IGBT devices,partial discharge and even breakdown phenomena occur frequently and the insulation design of devices is facing great challenges.In order to achieve good insulation design of devices,it is necessary to obtain the electric field distribution inside the devices.Therefore,accurate calculation of the electric field inside the devices is crucial.In this paper,the development of modeling and calculation methods for internal insulation structures of devices are reviewed comprehensively.Moreover,the application scope of corresponding research,related research progress and shortcomings are introduced from three aspects:electric field calculation of insulation structure of chip,electric field calculation of packaging insulation,and coupling electric field calculation with the chip insulation and package insulation both considered.Finally,the development direction of electric field calculation for insulation structures of devices is prospected.

insulated gate bipolar transistor(IGBT)device insulationpackaging structurechip termination structureelectric field calculation modelboundary value problem

刘招成、崔翔、李学宝、马楚萱、赵志斌

展开 >

新能源电力系统国家重点实验室(华北电力大学),北京市 昌平区 102206

绝缘栅双极型晶体管器件绝缘 封装结构 芯片终端 电场计算模型 边值问题

国家自然科学基金项目

52077073

2024

中国电机工程学报
中国电机工程学会

中国电机工程学报

CSTPCD北大核心
影响因子:2.712
ISSN:0258-8013
年,卷(期):2024.44(1)
  • 82