Review and Challenges of Characterization in High-voltage and High-power Devices
High-voltage and high-power devices are currently widely used in various large-capacity power conversion and control equipment,facing complex electrical-magnetic-thermal-mechanical stress during operation,characterized by high power density and complex operating conditions.Conducting characteristic tests of high-voltage high-power devices is beneficial for accurately assessing the reliability of power devices and guiding the optimization design of converters.Focusing on the quasi-online testing method utilizing double pulses,this paper comprehensively reviews the application and current development status of quasi-online testing in areas such as junction temperature extraction,aging characterization,safety boundary delineation,and electromagnetic field mapping.Then,it categorizes and examines the strengths,limitations,and applicability of various characteristic characterization methodologies.Furthermore,it further explores real-time status monitoring and life evaluation methods for power devices under online operating conditions.Additionally,the targeting third-generation silicon carbide semiconductor device,a new evaluation method based on electroluminescence principles,is proposed,providing guidance and reference for the subsequent reliability evaluation of high-voltage high-power devices.
万方数据
维普
