首页|基于失效演化模拟的电力机车用IGBT模块解析剩余寿命建模研究

基于失效演化模拟的电力机车用IGBT模块解析剩余寿命建模研究

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牵引变流器作为电力机车系统中最关键且故障率最高的设备,影响系统的安全运行,其中绝缘栅双极晶体管(insulated gate bipolar transistor,IGBT)模块是导致牵引变流器失效的主要部件.开展IGBT模块剩余寿命准确评估,对降低运维成本和系统故障率具有重要的战略价值和经济意义.目前采用"里程修"的运维方式,未考虑机车运行线路、工况、负载差异等因素对寿命的影响,导致一些线路过早更换的高昂运维成本和一些线路过晚替换的系统停运风险.因此,在牵引系统IGBT模块故障率高、运行线路间可靠性差异大且采用不合理的"里程修"方式背景下,目前业界普遍关心的问题是各线路基于固定里程修更换的 IGBT 模块剩余寿命是多少.该文针对电力机车用IGBT模块剩余寿命准确评估的问题,以IGBT模块焊料层不同服役里程空洞尺寸分布规律为基础,建立考虑焊料层空洞空间分布规律的精细化多物理场模型,开展多芯片并联IGBT模块失效演化物理过程模拟,提出以焊料层空洞分布统计规律为老化状态的电力机车用IGBT模块解析剩余寿命预测模拟,并通过功率循环试验验证改进模型准确性.研究成果丰富功率器件的寿命预测和可靠性评估理论,为系统从"里程修"向"状态修"转变提供科学依据.
Analytical Remaining Lifetime Modeling for Electric Locomotive IGBT Modules Based on Failure Evolution Simulation
Traction converter as the most critical equipment in the electric locomotive system with the highest failure rate affects the safety of the system,where insulated gate bipolar transistor(IGBT)modules are the weakest components causing the failure of traction converters.Accurate evaluation of the IGBT module's remaining lifetime has important strategic value and economic significance for reducing the operation and maintenance cost and system failure rate.However,the current mileage repair operation and maintenance method does not consider the influence of load,condition,and locomotive operating lines difference on the service life,which leads to high operation and maintenance costs for the early replacement and system outage risk for the late replacement.Therefore,due to the high failure rate,the large reliability difference among operating lines,and the unreasonable mileage repair method,the common industry concern is:what is the remaining lifetime for the repaired and replaced IGBT modules.Aiming at the problem of accurate remaining lifetime estimation of IGBT module for the electric locomotive,a refined multi-physical field model considering the void spatial distribution in the IGBT module solder layer is established,and the failure evolution physical process simulation of multi-chip parallel IGBT modules is carried out.The analytical remaining lifetime prediction model is proposed,where the statistical law of solder layer voids distribution is selected as the aging state,and the accuracy of the improved model is verified by power cycling tests.The intended outcome of this paper enriches the power device's lifetime prediction and reliability evaluation theory,meanwhile,it provides the scientific basis for the system to change from mileage maintenance to condition-based maintenance.

electric locomotiveinsulated gate bipolar transistor(IGBT)modulemorphological evolution simulationremaining lifetime model

赖伟、李涵锐、李辉、荆海燕、于凯、姚然、陈民铀

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输配电装备及系统安全与新技术国家重点实验室(重庆大学电气工程学院),重庆市 沙坪坝区 400044

中车永济电机有限公司,山西省 永济市 044502

电力机车 绝缘栅双极晶体管模块 形态演化模拟 剩余寿命模型

国家自然科学基金项目中央高校基本科研业务费资助项目山西省科技计划揭榜招标项目

U19662132022CDJKYJH00920201101017

2024

中国电机工程学报
中国电机工程学会

中国电机工程学报

CSTPCD北大核心
影响因子:2.712
ISSN:0258-8013
年,卷(期):2024.44(20)