Research on chip collaborative protection design method for TLP transient interference signals based on segmented linear model
Integrated circuit chips have encountered electromagnetic compatibility issues in the process of high-density and miniaturization development.To enhance the protective effect of integrated circuit chips against transient interference signals,a segmented linear model can be constructed by combining transmission line pulse(TLP)testing.Based on this,this article first analyzes the practical needs of chip protection design for transient interference signals,taking the CD4001BE chip as an example,a segmented linear modeling method for chip TLP testing is proposed,and the modeling method for transient voltage suppression TVS diodes is summarized.Furthermore,the collaborative protection design analysis of chip segmented linear models is carried out to control chip protection according to design time and cost using the segmented linear model.
Segmented linear modeltransmission line pulsetransient interference signalchip collaborative protection design
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