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扇出型封装EMI电磁屏蔽及部分屏蔽处理方案

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随着科技的进步,电子产品变得不可或缺.扇出型封装技术以其性能和设计灵活性受到关注,提高了芯片整合度和电性能.但高性能电子设备密度和复杂性增加带来电磁干扰(EMI)问题,影响设备运作和信号传输.因此,研发有效的电磁屏蔽技术至关重要.文章探讨了扇出型封装中的EMI问题,提出了电磁屏蔽设计方案,包括Die first方案和RDL first方案.文章总结了扇出型封装技术发展趋势,探讨了未来挑战并为EMI电磁屏蔽设计提供建议,期望启发未来研究和创新.
Fan-Out packaging for EMI electromagnetic shielding and partial shielding solutions
With the advancement of technology,electronic products have become indispensable.Fan-out packaging technology has gained attention for its performance and design flexibility,enhancing chip integration and electrical performance.However,the increasing density and complexity of high-performance electronic devices have brought about electromagnetic interference(EMI)issues,affecting device operation and signal transmission.Therefore,the development of effective electromagnetic shielding technology is crucial.This article explores EMI issues in fan-out packaging and proposes electromagnetic shielding design solutions,including the Die first approach and RDL first approach.This article summarizes the development trends in fan-out packaging technology,discuss future challenges,and provides recommendations for EMI electromagnetic shielding design,hoping to inspire future research and innovation.

advanced packagingEMIelectromagnetic coupling

张志伟、冯明宪、张一弛、刘小飞

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日月新(苏州)半导体有限公司 江苏 苏州 215000

厦门大学 福建厦门361005

先进封装 EMI 电磁耦合

2024

中国高新科技
中华预防医学会,国家食品安全风险评估中心

中国高新科技

ISSN:
年,卷(期):2024.(3)
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