首页|Simultaneous microwave characterization of wafer-level optoelectronic transceiver chips based on photonic sampling and mapping

Simultaneous microwave characterization of wafer-level optoelectronic transceiver chips based on photonic sampling and mapping

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Yutong HE、Xinhai ZOU、Ying XU、Zhihui LI、Naidi CUI、Junbo FENG、Yali ZHANG、Zhiyao ZHANG、Shangjian ZHANG、Yong LIU、Ninghua ZHU

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Research Center for Microwave Photonics,State Key Laboratory of Electronic Thin Films and Integrated Devices,School of Optoelectronic Science and Engineering,University of Electronic Science and Technology of China,Chengdu 610054,China

Chongqing United Microelectronics Center(CUMEC),Chongqing 400031,China

Xiongan Institute of Innovation,Chinese Academy of Sciences,Xiongan 071899,China

National Natural Science Foundation of ChinaFundamental Research Funds for the Central Universities

61927821ZYGX2019Z011

2024

中国科学:信息科学(英文版)
中国科学院

中国科学:信息科学(英文版)

CSTPCDEI
影响因子:0.715
ISSN:1674-733X
年,卷(期):2024.67(2)
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