中国科学:信息科学(英文版)2024,Vol.67Issue(4) :285-296.DOI:10.1007/s11432-022-3878-5

Post-layout simulation driven analog circuit sizing

Xiaohan GAO Haoyi ZHANG Siyuan YE Mingjie LIU David Z.PAN Linxiao SHEN Runsheng WANG Yibo LIN Ru HUANG
中国科学:信息科学(英文版)2024,Vol.67Issue(4) :285-296.DOI:10.1007/s11432-022-3878-5

Post-layout simulation driven analog circuit sizing

Xiaohan GAO 1Haoyi ZHANG 2Siyuan YE 2Mingjie LIU 3David Z.PAN 3Linxiao SHEN 2Runsheng WANG 4Yibo LIN 4Ru HUANG4
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作者信息

  • 1. School of Integrated Circuits,Peking University,Beijing 100871,China;School of Computer Science,Peking University,Beijing 100871,China
  • 2. School of Integrated Circuits,Peking University,Beijing 100871,China
  • 3. Department of Electrical and Computer Engineering,University of Texas at Austin,Austin 78712,USA
  • 4. School of Integrated Circuits,Peking University,Beijing 100871,China;Institute of Electronic Design Automation,Peking University,Wuxi 214000,China
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Abstract

Post-layout simulation provides accurate guidance for analog circuit design,but post-layout performance is hard to be directly optimized at early design stages.Prior work on analog circuit sizing often utilizes pre-layout simulation results as the optimization objective.In this work,we propose a post-layout-simulation-driven(post-simulation-driven for short)analog circuit sizing framework that directly optimizes the post-layout simulation performance.The framework integrates automated layout generation into the optimization loop of transistor sizing and leverages a coupled Bayesian optimization algorithm to search for the best post-simulation performance.Experimental results demonstrate that our framework can achieve over 20%better post-layout performance in competitive time than manual design and the method that only considers pre-layout optimization.

Key words

analog EDA/transistor sizing/Bayesian optimization/post-layout simulation

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基金项目

国家自然科学基金(62141404)

国家自然科学基金(62034007)

111 Project(B18001)

出版年

2024
中国科学:信息科学(英文版)
中国科学院

中国科学:信息科学(英文版)

CSTPCDEI
影响因子:0.715
ISSN:1674-733X
参考文献量32
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