首页|基于ANSYS的真空断路器温升仿真迭代方法验证及其应用

基于ANSYS的真空断路器温升仿真迭代方法验证及其应用

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真空断路器单一的触头结构对其设计提出更高要求,需要通过准确的仿真平衡触头电阻及其励磁性能;同时通流参数的提升以及小型化、紧凑化的发展理念,使得其发热程度不断加剧且散热效果受到制约.在输电等级,真空断路器的温升已逐渐成为制约其通流性能参数提升的核心因素之一,温升的仿真分析对于产品开发至关重要.然而温升不仅能够改变材料电阻率影响发热过程,还会通过改变表面换热系数影响散热过程,需要根据温度变化不断修正材料参数.基于ANSYS Maxwell及Fluent的迭代耦合仿真方法,结合工程经验给定初始温升值从而建立热场与流场之间的耦合关系,通过将假定的初始温升值与对应仿真结果取平均值并作为下次计算初始值进行不断迭代,直至当次计算结果与给定初值满足给定误差范围,即为稳态温升仿真结果.采用该方法指导设计出真空断路器实物样机,通流4000 A进行温升试验验证.试验结果表明:采用该迭代耦合方法得到的断路器各处温升值与试验结果相差不大,最大偏差9%,验证了本方法和有限元模型的准确性.
Validation and Application of ANSYS-based Iterative Method for Vacuum Circuit Breaker Temperature Rise Simulation
The singular contact structure of vacuum circuit breakers necessitates more stringent design re-quirements,emphasizing the need for precise simulation to balance the contact resistance and its magnetic excita-tion characteristics.The pursuit of enhanced current-carrying capabilities and the trend towards miniaturization and compactness have exacerbated the heat generation within these devices,while simultaneously limiting their cooling efficiency.In the context of power transmission,the temperature rise in vacuum circuit breakers has be-come a pivotal factor constraining the enhancement of their current-carrying performance parameters.Simulation analysis of temperature rise is of paramount importance for product development.The temperature rise not only alters the resistivity of materials,thereby affecting the heat generation process,but also impacts the cooling process by modifying the surface heat transfer coefficient,necessitating continuous adjustments to material param-eters in response to temperature variations.This paper introduces an iterative coupling simulation approach based on ANSYS Maxwell and Fluent,leveraging engineering experience to establish an initial temperature rise value.This value is used to create a coupling relationship between the thermal and flow fields.By averaging the as-sumed initial temperature rise with the corresponding simulation results and using this average as the initial value for subsequent calculations,the process is iterated until the simulation results fall within a predefined error range of the initial value,yielding a steady-state temperature rise simulation outcome.The proposed method is applied to guide the design of a vacuum circuit breaker prototype,which is subjected to a temperature rise test at a cur-rent of 4000A.The experimental results indicate that the temperature rise values at various points of the circuit breaker,as determined by the iterative coupling method,are in close agreement with the test outcomes,with the maximum discrepancy being within 9%.This validates the accuracy of the method and the finite element model employed.

Vacuum circuit breakersTemperature riseIterative simulation

马朝阳、赵晓民、李旭旭、李小钊、孙广雷、赵芳帅、李永林、毕迎华

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平高集团有限公司,河南平顶山 467000

真空断路器 温升 迭代仿真

2024

真空电子技术
北京真空电子技术研究所

真空电子技术

影响因子:0.166
ISSN:1002-8935
年,卷(期):2024.(6)