首页|Comparative transcriptome analysis of the Eureka lemon in response to Citrus yellow vein virus infection at different temperatures

Comparative transcriptome analysis of the Eureka lemon in response to Citrus yellow vein virus infection at different temperatures

扫码查看
The production of Eureka lemons (Citrus limon) is severely affected by Citrus yellow vein clearing virus (CYVCV). The symptoms induced by CYVCV in Eureka lemons can be reduced at high temperatures. To better understand the molecular mechanisms involved in Eureka lemon responses to CYVCV at high temperatures, chlorophyll content, protective enzyme activities, and chloroplast ultramicrostructure were analyzed in Eureka lemons infected with CYVCV and grown at 25 degrees C and 37 degrees C. Chlorophyll content, activity of ascorbate peroxidase (APX), and catalase (CAT) activity were significantly higher in CYVCV-infected lemons grown at 37 degrees C than at 25 degrees C. Leaf transcriptomics were also investigated in CYVCV-infected and mock-inoculated Eureka lemons grown at 25 degrees C and 37 degrees C. Functional analysis indicated that the differentially expressed genes (DEGs) including resistance-related genes (AGO4, PAL), chlorophyll degradation-related genes (CHL-1, CHL-2), antioxidant enzymes (APX2), and Transcription Factors (TFs) (MYB1R1/s3/12/14/48/111) might have been associated with the reduction in symptoms of CYVCV-infected Eureka lemons grown at higher temperature. This evidence contributes to a theoretical foundation for further study into the molecular basis underlying the interaction between Eureka lemons and CYVCV at high temperatures.

Citrus yellow vein clearing virusEureka lemonComparative transcriptomeSymptom recoveryCLEARING-VIRUSCHLOROPHYLL DEGRADATIONRESISTANCEPEROXIDASERECOVERYDEFENSEPLANTS

Wang, Ying、Liao, Ping、Zhao, Jin fa、Zhang, Xing kai、Liu, Chuang、Xiao, Ping an、Zhou, Chang yong、Zhou, Yan

展开 >

Southwest Univ

Lemon Ind Dev Ctr

2022

Physiological and Molecular Plant Pathology

Physiological and Molecular Plant Pathology

SCI
ISSN:0885-5765
年,卷(期):2022.119
  • 1
  • 45