Sri PURWIYANTIArief UDHIARTORoland NOWAKDaniel MORARU...
25-30页
查看更多>>摘要:In this work, we report the experimental observation of dopant signature in nanoscale ultra-thin SOI pn junctions. At temperatures below 30 K, we observed current fluctuations as random telegraph signal (RTS) in the dark and under light illumination. In the dark, two levels of RTS have been observed, suggesting that a charge moving as part of diffusion current may be trapped by an ionized dopant in the depletion layer. The RTS under light illumination has been observed only in pn junction devices, but not in pin junction devices, suggesting that the RTS is promoted in pn junctions due to trapping and detrapping of photogenerated carriers by donor-acceptor pair in the depletion layer. Observation of potential fluctuations due to trapping and detrapping events by Kelvin probe force microscopy (KFM) has also been reported. These results illustrate the nature of individual dopants in nanoscale pn junctions and their impact on device characteristics.