欧阳钟灿
月刊
1674-1056
010-82649026 82649519
100080
北京603信箱
scanning transmission electron microscopymaterials sciencepoint defectsartificial intelligence
AC-STEMquantitative analysispolarizationelectronic functional materials
image forming and processingphase retrievalelectron microscopyscanning transmission elec-tron microscope(STEM)
compressive sensing4-D STEMinpainting
hexagonal ferritesferroelectricmultiferroictopological defectSTEM
broadband photon pair sourcespontaneous parametric down-conversiondispersion engineeringthin-film lithium niobate waveguide
asynchronous measurement-device-independent quantum key distributionintensity fluctuationsafterpulsedead time
non-destructivefritting contactqubit frequencyJosephson junction resistance
self-trapped excitonAg-based ternary halidesconfiguration coordinate diagramsemission effi-ciency
high harmonic generation(HHG)femtosecond extreme ultraviolet pulseconical diffractiongrat-ing monochromatortransientspectral experiment